Integrated circuit
4
4000 series
5
555 timer IC
7
List of 7400 series integrated circuits
7400 series
7805
7812
8
8250 series
A
AY-3-8500
Application-specific integrated circuit
Atari POKEY
B
Beetle (ASIC)
Built-in self-test
C
Charge-coupled device
Chip art
Circuit extraction
Cleanroom
Clock signal
Critical area
D
Delay calculation
Delay-locked loop
Die (integrated circuit)
Digital signal processor
E
EDA database
EPROM
Electromagnetic field solver
Elmore delay
F
Fault coverage
Fluorosilicate glass
Full custom
Fully differential amplifier
G
GATTO
Gold-aluminium intermetallics
H
High Precision Event Timer
High Speed Strap Attach Machine
Hot carrier injection
I
IC power supply pin
IRSIM
Iddq testing
Integrated circuit design
Integrated circuit development
Integrated injection logic
Intel 8255
Intel 8259
Inverter (logic gate)
Irreversible circuit
L
LM317
LM3875
Latchup
Lee algorithm
List of 4000 series integrated circuits
M
MK484
MOSIS
Magic (software)
Mask work
Mead & Conway revolution
Moisture Sensitivity Level
Monolithic Microwave Integrated Circuit
Motorola 68881
N
NCR 5380
NCR 53C9x
Network On Chip
Network Search Engine
Neurochip
Noise margin
O
Operational amplifier
Operational amplifier applications
Operational transconductance amplifier
P
P-n junction isolation
PHY
PSoC
Bob Pease
Pin-compatibility
Placement (EDA)
Principle of logical effort
Q
Quality of results
R
RC delay
Radiation hardening
Real-time clock
Repeater insertion
Resistor–transistor logic
Routing (EDA)
S
Scan chain
Semiconductor device modeling
Semiconductor memory
Semiconductor process simulation
SiGe
Substrate coupling
System in package
System-level solution
T
TMS6100
Technology CAD
Texas Instruments LPC Speech Chips
U
16550 UART
V
VLSI Project
VerilogCSP
Very-large-scale integration
X
Xceive XC3028
Z
ZMD
4
4000 series
5
555 timer IC
7
List of 7400 series integrated circuits
7400 series
7805
7812
8
8250 series
A
AY-3-8500
Application-specific integrated circuit
Atari POKEY
B
Beetle (ASIC)
Built-in self-test
C
Charge-coupled device
Chip art
Circuit extraction
Cleanroom
Clock signal
Critical area
D
Delay calculation
Delay-locked loop
Die (integrated circuit)
Digital signal processor
E
EDA database
EPROM
Electromagnetic field solver
Elmore delay
F
Fault coverage
Fluorosilicate glass
Full custom
Fully differential amplifier
G
GATTO
Gold-aluminium intermetallics
H
High Precision Event Timer
High Speed Strap Attach Machine
Hot carrier injection
I
IC power supply pin
IRSIM
Iddq testing
Integrated circuit design
Integrated circuit development
Integrated injection logic
Intel 8255
Intel 8259
Inverter (logic gate)
Irreversible circuit
L
LM317
LM3875
Latchup
Lee algorithm
List of 4000 series integrated circuits
M
MK484
MOSIS
Magic (software)
Mask work
Mead & Conway revolution
Moisture Sensitivity Level
Monolithic Microwave Integrated Circuit
Motorola 68881
N
NCR 5380
NCR 53C9x
Network On Chip
Network Search Engine
Neurochip
Noise margin
O
Operational amplifier
Operational amplifier applications
Operational transconductance amplifier
P
P-n junction isolation
PHY
PSoC
Bob Pease
Pin-compatibility
Placement (EDA)
Principle of logical effort
Q
Quality of results
R
RC delay
Radiation hardening
Real-time clock
Repeater insertion
Resistor–transistor logic
Routing (EDA)
S
Scan chain
Semiconductor device modeling
Semiconductor memory
Semiconductor process simulation
SiGe
Substrate coupling
System in package
System-level solution
T
TMS6100
Technology CAD
Texas Instruments LPC Speech Chips
U
16550 UART
V
VLSI Project
VerilogCSP
Very-large-scale integration
X
Xceive XC3028
Z
ZMD
